We also recognize that, you, our customers - being as diverse as you are - expect in-circuit test equipment to be flexible in addressing your additional
We weren't sure who would need which features, so we included the following options to ensure you could customize our in-circuit testers to shrink your manufacturing processes and reap the
maximum value for your investment.
- Bode Scan
- Power-up Test
- Boundary Scan JTAG) Test
- Advanced Function Test
- Flash Device Programming
- In-System Device Programming
We are also quite sure that none of our customers want to pay for features they won't use. That is why the most flexible, feature-rich in-circuit test platform on the market comes with the
most affordable price tags to fit your requirements and budget.
- Rapid realization of test
- Comprehensive set
of ICT test options
- Graphical program
- Reliable measurement
- Boundary Scan
- In-circuit programming
- Fast test times
- Functional testing
- Graphical CAD-to-Tester
- Power-up testing
- Expandable to meet your
- SMEMA compatibility
HIGH PERFORMANCE ANALOG MEASUREMENT SYSTEM
The Scorpion family of test equipment all feature an analog measurement system
consisting of a Measure and Stimulus instrument (M&S) with flexible bi-directional routing
between instruments and receiver pins. Under program control, each of the analog
measurement and stimulus instruments are set up and routed to their assigned pins for
each test performed. The non-multiplexed architecture of Scorpion ICT series
improves test performance and simplifies fixture design and test generation.
The M&S module provides stimulus and measurement facilities for detecting shorts,
opens, and incorrect component values on the Unit Under Test (UUT). In-circuit
measurement of resistance, capacitance, and inductance identify actual component values. Analog functional testing can also verify power on component parameters such as transistor
beta, op amp closed loop gain, diode characteristics, and transfer characteristics.
Patented Vectorless Test
Vectorless test was pioneered in 1990 by ITA/Scorpion, (part of the Acculogic Group).
In the last few years, it has become the preferred method to find “opens” faults around
large pin count digital devices. This test method has rendered the lengthy process of
test pattern development required to inspect complex VLSI parts on traditional In-Circuit testers obsolete. Acculogic's Open Pin detection consists of two complimentary
tools for the Scorpion iCT7000-series of testers; CScan™ and ChipScan™.
- CScan™ Detects open leads on ICs including BGAs, reverse electrolytic
capacitors, connector pins, and decoupling capacitors
- ChipScan™ Detects open leads on ICs including BGAs with heat sinks
BodeScan™ is a patented, built-in network analyzer for detecting missing or incorrect
small value components in complex RF networks
ADVANCED FUNCTION TESTING
Advanced Function Test expands the capabilities of the Scorpion ICT beyond basic
manufacturing process test. External commercially available instruments integrate
directly with the Scorpion iCT and signal lines are routed to the fixture receiver under
software control. Each instrument's graphical user interface (GUI) provides an intuitive
representation of the instrument controls and functions. Configuring instruments for a
measurement is as simple as setting the dials. Once the parameters for a particular
measurement are configured, program steps within the Integrator software environment
flow seamlessly. Instrument drivers are based on Interchangeable Virtual
Instrument (IVI) protocols thus allowing easy and fast instrument replacement.
Acculogic Integrator™ Software
Integrator™ software is the comprehensive, easy-to-use graphical test generation and
runtime environment for all Scorpion In-Circuit and Flying Probe Test Systems. This
software offers Acculogic customers a highly effective user-friendly environment for
producing and executing test programs.
Automatic or interactive program generation
Integrator™ software accepts CAD data from a variety of board design and layout
sources. Integrator uses the CAD data, Bill of Materials (BoM), and netlist to create a
high fault coverage test program and generate the complete fixture design and fabrication
information. A highly automated process, most elements of the test program can be
automatically generated in minutes.
Wide Test Coverage at Impressive Speeds
Evolving test requirements are met through modular expansion of the system with a
broad array of innovative, patented test features: CScan, ChipScan, BodeScan or
Memory Programming Module (MPM). The result is extremely fast and extensive
testing that minimizes false fails.
The logical subdivision of the systems into control computer, power supply and
measurement/switching unit guarantees ease of integration into any test environment.
Its modularity based on the 19”standard rack allows cost-effective incorporation into
any production environment.