SpeedPlus testing is a method of reducing test times by engaging bottom side
fixed position probes when performing analog tests. The use of up to 9 fixed
probes on the bottom side of the UUT allows the software step optimizer to
sequence tests in an order that will provide maximum testing in each movement.
Sprint’s Motion Optimizer gives the programmer the ability to sort tests into
logical groups for debugging, then resort the steps to a production ready lean
runtime format. The Sprint4510 with its Tandem Test Mode (TTM) enable the
machine to perform up to six measurements with one movement of the 4 flying
probes. With the addition of SpeedPlus and bottom side probing this number
increases by four with every additional fixed probe such that by adding nine fixed
probes the tester can effectively test up to 42 steps with only one movement.
Acculogic Open-Pin-Detect (OPD) toolset for power-off “Vectorless” detection
of open pins on digital and mixed-signal devices is an important test capability.
OPD provides fast programming and comprehensive manufacturing process
D-Scan and C-Scan Vectorless tests extend fault coverage to any IC, including
BGAs and ICs with heat sinks, as well as connectors and polarized capacitors.
D-Scan, which is available on any combination of Flying and Fixed probes, uses
protection (parasitic) diodes built into many devices to test failing pins. One
stationary probe is required per power supply node.
C-Scan is available on all four Flying heads and uses a capacitive coupling
technique to check for open pins on ICs with no protection diodes. It can be
used to check for opens on connectors and orientation of polarized capacitors.
Each C-Scan probe assembly includes one retractable capacitive sensor.
Automatic Optical Inspection (AOI)
Vision test automatically inspects for presence, absence, and orientation of ICs,
bypass capacitors, and components that are not electrically testable. Vision test
is fully integrated with the Sprint 4510 APG and enhances overall fault coverage.
Comprehensive Fault Coverage Reporting
Sprint 4510 Fault Coverage Reporter automatically analyses board topology and
the test program, and reports on the effectiveness of the test. Reports are
compatible with Microsoft Excel format for further analysis and presentation.
The coverage report starts with a summary by component type, test technique
and status of test. The drill down capability allows users to examine each device
on a pin-by-pin basis, thus providing a full view of the overall pro gram fault
StatManagerSPC™ Statistical Process Control Software
StatManagerSPC software is a powerful statistical process control (SPC) tool
that analyzes and identifies variations in test results due to variations in process
environment. Using a series of measurements made repeatedly on a single board
or on batches of production boards, developers are able to identify measurements
that are least stable. They can then examine these measurements for
root causes of instability and then alleviate these causes. StatManagerSPC allows
developers to analyze test variance due to noise, component variation, drift, and
system variance. Test limits can be updated automatically under user control to
obtain solid production-ready tests.
- 1690 mm (width) x 1430 mm (depth) x 1670 mm (height)
- 66 inches (width) x 56.3 inches (depth) x 65 inches (height)
Open-Pin-Detect vectorless tool suite
- C-Scan with four sensors
- D-Scan all heads
- Test for orientation, missing, wrong component
- User graphic device library
- Boundary Scan Test and Device Programming (two ports)
- Advance Function Test System (AFTS)
- Timer Counter and Function Generator
Full System Specifications Available at request. Specifications are
continuously improved and updated, contact your local sales channel for a