ScanMaster™ is a powerful, high speed JTAG (IEEE 1149.1) controller designed for use in design verification, production test, and on-board device programming applications. Utilizing its proprietary JPCI™ bus-master with high speed cache memory behind TDI and TDO, Adaptive Clocking™ technology, and a 32-bit PCI bus architecture, ScanMaster™ eliminates bottlenecks to data delivery. This is critical to applications like Flash programming where large amounts of data must be processed and delivered. From the exchange of data with the host computer through to delivery of vectors to targets, ScanMaster™ has been designed for high bandwidth, which enables delivery of data at speeds up to 25 Mbits/Sec.

Features:

• High performance plug & play PCI based controller
• JPCI™ 32-bit (IEEE 1149.1) bus controller
• Fast throughput of up to 25 Mbits/sec
• 100 MHz system clock and up to 35 MHz programmable TCK rate
• Adaptive Clocking™ Technology
• 32 general purpose fully programmable parallel I/O channels
• 2 MB cache multi-page memory behind TDI/TDO
• Two 24 bit analog channels
• Performs non-compliant test access port (TAP) operations
• Meets addressable scan port (ASP) requirements
• Supports industry standard vector formats SVF, JAM/STAPL, IEEE 1532
• Programmable logic levels (1.8V to 5.0V)
• Configurable to service up to 16 individual scan chains or targets

JPCI test bus controller

JPCI™ is a proprietary 32-bit (IEEE1149.1) bus-master that eliminates performance bottlenecks present in most commercial JTAG controllers. In addition to TAP control circuitry, JPCI™ relies on a built in PCI interface, Adaptive Clocking™ technology, and multi-page memory backed TDI & TDO to facilitate high data throughput to targets. Equipped with a 100 MHz system clock, JPCI’s unique architecture eliminates transmission inefficiencies and provides reliable, fast data transmission rates of up to 25 Megabits/sec to targets without imposing physical proximity constraints. more...

Adaptive Clocking™ Technology

Adaptive Clocking™ enables operation of the JTAG port at high TCK rates, while eliminating the effect of path delays between the controller and the target. It mitigates instabilities and intermittencies caused by high-speed operation. This proprietary technique compensates for path delays, allowing the ScanMaster™ controller to operate at the maximum TCK rate tolerated by target devices.

With the effects of path delay eliminated, and not requiring the use of re-timing PODS, the ScanMaster™ controller can be located an ergonomically suitable distance (up to 15 meters) away from the target. This not only eliminates the adverse effects of PODS on test/program reliability and repeatability, but also alleviates space constraints PODs impose on production fixture set-ups. more ...

32 fully programmable parallel I/O channels

ScanMaster has 32 fully programmable parallel I/O channels. These channels are used under program control to disable conflicting devices on the DUT, and toggle control circuitry of programmable parts such as Flash memories. The logic levels on these channels can be set to 3.3V or 5V.

2 MB multi-page cache memory behind TDI/TDO

In programming and test applications large sets of data flow through TDI and TDO. Cache memory allocated to TDI and TDO allows smooth flow of data to and from the target and prevents frequent interruptions. Multi-page memory enables short read/write cycles between cache memory and PCI bus controller, thus enabling JPCI™ to spend minimal time performing memory related operations.

Analog Channels

ScanMaster’s™ unique analog channels can safeguard the target by continuously monitoring user specified parameters of the target to prevent possible damage during testing and/or device programming:

• Pre-power up ‘shorts’ testing on power and ground lines
• Monitoring board current draw
• General purpose analog measurement
• Analog measurements to detect manufacturing faults

ScanMaster™ operating environments

ScanNavigator RTE features a comprehensive graphical user environment for ScanMaster setup and runtime control. Through the ScanNavigator RTE, ScanMaster executes boundary scan test and on-board programming routines and can easily be set up to perform conditional looping and branching operations - a critical feature for program debug and execution of diagnostic routines. ScanMaster can also be controlled through DLL calls using test executives such as National Instruments' TestStand and Teradyne's TestStudio, or through direct API access with language-based programming.

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