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Multi Clock Divider Board (Test High Frequency Signal Generating devices with your ATE)

When to use: The Multi Clock Divider Board (MCD) Clock provides a one board solution, capable of accepting a wide frequency bandwidth, for the testing of signal generating devices such as crystals and oscillators.

Why use: The low-cost MCD replaces the need for an expensive IEEE controlled counter. Designed for simple installation in the test fixture, it integrates the function of several instruments onto one board.

Overview

The Multi Clock Divider Board operates by dividing down the input signal to fall within the measurement range of the test system. The divide sequence is selectable through the use of on-board jumpers or programmable by the tester pins under software control. The MCD supports up to 7 different TTL & 1 programmable threshold inputs at frequencies in excess of 100 MHz. This includes CMOS, ECL, PECL, TTL, and analog signals (range of +/- 5V).

The divide sequence programmable range is 1/2, 1/4, 1/8, 1/16, 1/32, 1/64, 1/128 and 1/256. During the oscillator test, the high frequency module can be totally isolated from the tester to minimize the impact of the system capacitance on measurement.

Features

  • 100 MHz input frequency bandwidth
  • 7 TTL clock inputs
  • 1 programmable analog input (+/- 5V)
  • High impedance analog input (5MW II 1pF, 500nA/V)
  • Programmable divide sequence
  • Signal isolation through on board relay
  • Crystal and oscillator testing


Relay Expander Module - REM-08

When to use: The Relay Expander Module (REM-08) is a powerful, and versatile control module with a wide range of applications. It is designed for use in various capacities for the testing and control of electronic circuitry. The power of the REM-08 is inherent in its ease of use and the great flexibility provided over control and configuration of its general purpose relays.

Overview

Modes Of Operation

  • Power-ON
  • Power-OFF

The REM-08 imposes minimal requirement on the resources of the main system controller or the Automated Test Equipment (ATE). To operate in the POWER ON mode, the only requirements are +5V for the power input, and 5 signals for the full control of 8 relays or 6 signals for the control of 16 relays. Two REM-08s can operate in Master/Slave configuration, which doubles the number of relays (to 16) and only requires 1 additional control line.

In POWER OFF applications, the REM-08 can be used through a dedicated connector with only one control line per relay (this port is also accessible in POWER ON mode for enhanced control).

The Relays used on the REM-08 are of the latching type, which maintain a setting even through complete power up & down cycles.

Inputs and Outputs

The REM-08 is designed with 8 double pole/double throw relays, which can switch 16 inputs to 32 outputs (or 32 inputs to 16 outputs). These numbers can be doubled by combining two REM-08s in a Master/Slave mode.

Current Ratings

  • Each relay can handle up to 4A @ 30 V DC, or 1.2 A @ 125 V AC.
  • Each relay contact can handle up to 2A/30 V DC, or 600 mA/125 V AC.

Power Requirements

The REM-08 requires +5V external power to operate, the on-board switching power supply generates the -5V required . The normal power consumption of REM-08 is about 500mW except during the clocking of the relays where it can increase up to 2W, however this is only 40-60 m sec. in duration.

To eliminate any EMI that may be generated by the on-board switching power supply, power is only applied during the initialization and configuration of the relays (<60 m sec).


The Driver Board (for Boundary Scan TCK lines)

When to Use: A high percentage of boards that are tested using in-circuit testers (ICT), have boundary scan devices. These components may have individual JTAG port access or be connected in a chain, sharing common TCK and TMS signals. Since communication with the testing device(s) is done on a serial basis, clean signals and good waveforms are critical.

It is especially difficult to achieve stable conditions in an ICT environment, where noise level is significant and cross talk between numerous wires housed in the test fixture is high. These factors may cause false test failures and difficulties while debugging, or running the test program on different testers. Long chains are particularly sensitive to noise, and special tests like VIT and VCCT are impossible to apply without a “good” clock.

The use of passive components, such as capacitors or filters, to mitigate these unwanted effects does not always provide satisfactory results.

Why use: The Driver Board actively filters and restores signals thereby eliminating the instability caused by noise, cross talk and bad tester drivers. Consequently, test debugging time is significantly reduced and the implementation of VIT and VCCT tests is facilitated.

Overview

  1. Filters noise, which is higher than the frequency of the tester highest digital stim.
  2. Corrects and conditions bad waveform
  3. Has bypass capability to perform test for passive components on the same net
  4. Small form factor allows it to be mounted as close as possible to source of the noise
  5. Can be easily installed in the test fixture
  6. Versatile - can be used for a variety of applications.

The Driver Board is manufactured in 2 and 4 channel versions. The bottom side of the board is flat, as a result, it can be mounted in the fixture without the need for screws.

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