BSID generates high-resolution diagnostics for three VICTORY tests:

• VIT
• VCCT
• BICT

BSID can be run on a test system as part of a comprehensive test program or run off-line at a diagnostic repair station. When a boundary-scan test fails, BSID uses the failure data generated by a VICTORY module and the digital test results generated by a tester to isolate the failing devices and the networks involved. To generate diagnostics for a virtual cluster test, BSID uses fault dictionary techniques and must be supplied with a fault dictionary database.
BSID quickly isolates common faults such as shorts, opens, and stuck-at pins, as well as difficult to detect strong driver shorts and bus faults.